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authorZhihao Cheng <chengzhihao1@huawei.com>2024-11-11 17:08:24 +0800
committerDavid Oberhollenzer <david.oberhollenzer@sigma-star.at>2024-11-11 10:32:46 +0100
commit16765dd7f46549527523e8a6d48fa3a1da887b1f (patch)
tree2fb72c87a55600f76d0a87c12a46a4c4577ce276 /tests/mtd-tests/flash_speed.c
parente06aa684857345f8be397a481cf726a1051734d7 (diff)
tests: ubifs_tools: fsck_tests: Add random_corrupt+fsck test
Inject random corruption on UBIFS image by writting random data on kinds of mtd devices (eg. nand, nor), check the consistency of UBIFS after fsck. This testcase simulates random bad UBIFS image caused by hardware exceptions(eg. ecc uncorrectable, unwritten), and makes sure that fsck.ubifs could make UBIFS be consistent after repairing UBIFS image. Signed-off-by: Zhihao Cheng <chengzhihao1@huawei.com> Signed-off-by: David Oberhollenzer <david.oberhollenzer@sigma-star.at>
Diffstat (limited to 'tests/mtd-tests/flash_speed.c')
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