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author | Zhihao Cheng <chengzhihao1@huawei.com> | 2024-11-11 17:08:24 +0800 |
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committer | David Oberhollenzer <david.oberhollenzer@sigma-star.at> | 2024-11-11 10:32:46 +0100 |
commit | 16765dd7f46549527523e8a6d48fa3a1da887b1f (patch) | |
tree | 2fb72c87a55600f76d0a87c12a46a4c4577ce276 /tests/mtd-tests/flash_speed.c | |
parent | e06aa684857345f8be397a481cf726a1051734d7 (diff) |
tests: ubifs_tools: fsck_tests: Add random_corrupt+fsck test
Inject random corruption on UBIFS image by writting random data on
kinds of mtd devices (eg. nand, nor), check the consistency of UBIFS
after fsck.
This testcase simulates random bad UBIFS image caused by hardware
exceptions(eg. ecc uncorrectable, unwritten), and makes sure that
fsck.ubifs could make UBIFS be consistent after repairing UBIFS
image.
Signed-off-by: Zhihao Cheng <chengzhihao1@huawei.com>
Signed-off-by: David Oberhollenzer <david.oberhollenzer@sigma-star.at>
Diffstat (limited to 'tests/mtd-tests/flash_speed.c')
0 files changed, 0 insertions, 0 deletions