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author | Harpreet Eli Sangha <harpreet@nestlabs.com> | 2017-06-30 15:12:18 -0700 |
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committer | David Oberhollenzer <david.oberhollenzer@sigma-star.at> | 2017-07-03 10:19:29 +0200 |
commit | df913e4316f28d60f630bac938863c4c65ad210e (patch) | |
tree | 26c853bcdce6276e9d87263323de8c3a11bdc55c /jffsX-utils/compr.c | |
parent | f8bc7d94761f6153be606328183fac6766202914 (diff) |
mtd-utils: tests: Add Erased Pages Bit Flip Test
Bit flip detection for written and erased pages tend to have different
implementations. Where written pages are detected and corrected using
ECC, erased pages are typically detected by ensuring that the number of
zeros is less than a specified threshold.
As such, it's necessary to have the 'nandbiterrs' test support the
testing of written and erased pages. Bit flips in erased pages are
emulated by rewriting the page in raw mode, to prevent the use of ECC.
Signed-off-by: Harpreet Eli Sangha <harpreet@nestlabs.com>
Signed-off-by: David Oberhollenzer <david.oberhollenzer@sigma-star.at>
Diffstat (limited to 'jffsX-utils/compr.c')
0 files changed, 0 insertions, 0 deletions