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authorHarpreet Eli Sangha <harpreet@nestlabs.com>2017-06-30 15:12:18 -0700
committerDavid Oberhollenzer <david.oberhollenzer@sigma-star.at>2017-07-03 10:19:29 +0200
commitdf913e4316f28d60f630bac938863c4c65ad210e (patch)
tree26c853bcdce6276e9d87263323de8c3a11bdc55c /jffsX-utils/compr_lzo.c
parentf8bc7d94761f6153be606328183fac6766202914 (diff)
mtd-utils: tests: Add Erased Pages Bit Flip Test
Bit flip detection for written and erased pages tend to have different implementations. Where written pages are detected and corrected using ECC, erased pages are typically detected by ensuring that the number of zeros is less than a specified threshold. As such, it's necessary to have the 'nandbiterrs' test support the testing of written and erased pages. Bit flips in erased pages are emulated by rewriting the page in raw mode, to prevent the use of ECC. Signed-off-by: Harpreet Eli Sangha <harpreet@nestlabs.com> Signed-off-by: David Oberhollenzer <david.oberhollenzer@sigma-star.at>
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